FT-340 高温四探针电阻率测试系统
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FT-340 高温四探针电阻率测试系统的详细资料 | ||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||
FT-351高温四探针电阻率测试系统 FT-351 high temperature four probe resistivity test system 一.概述:overview 采用四探针双电组合测量方法测试方阻和电阻率系统与高温箱结合配置专用的高温四探针测试探针治具与PC软件对数据的处理和测量控制,满足半导体材料的电导率对温度变化测量要求,的测控软件实时绘制出温度与电阻,电阻率,电导率数据的变化曲线图谱,及过程数据值的报表分析.
Adopt four probe double electric
combination test method to test square resistance and resistivity system .
Combined with high temperature box for special high temperature four-point
probe test probe jig with PC software for data processing and measurement
control. Meet the test requirements of
the co FT-351高温四探针电阻率测试系统二.适用行业:Applicable industry: 广泛用于:企业、高等院校、科研部门对导电陶瓷、硅、锗单晶(棒料、晶片)电阻率、测定硅外延层、扩散层和离子注入层的方块电阻以及测量导电玻璃(ITO)和其它导电薄膜等新材料方块电阻、电阻率和电导率数据.
Is widely used in: Corporate. colleges and
universities and scientific research departments of co 双电测四探针仪是运用直线四探针双位测量。设计符合单晶硅物理测试方法标准并参考美国 A.S.T.M 标准。
The double electric four-point probe is
used to measure the four probes in a straight line.The design co
FT-351高温四探针电阻率测试系统
配套方案:解决各材料状态 --固态、液态、气态、颗粒状电阻、电阻率、电导率测量 ![]() |
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