手持式四探针方阻测试仪

一.概述Overview：

参照硅片电阻率测量的标准（ASTM F84）及标准设计制造该仪器设计符合GB/T 1551-2009 《硅单晶电阻率测定方法》、GB/T 1551-1995《硅、锗单晶电阻率测定直流两探针法》、GB/T 1552-1995《硅、锗单晶电阻率测定直流四探针法》，采集高集成电路恒流源系统，提供便捷的操作模式，便携式外型结构，可充电式电源系统，超长待机，上下限设定.Reference  Silicon resistivity measurement international standards (ASTM F84) and national standard design and manufacture of the equipment is designed in accordance with GB/T 1551-2009 "Method of determination of silicon single crystal resistivity”. GB/T 1551-1995" the single crystal silicon. germanium resistivity measurement of DC double probe method”. GB/T 1552-1995 "the single crystal silicon. germanium resistivity measuring DC four-probe method".  With High precision intensive circuit constant current source system. Provide a convenient  operation mode. portable appearance structure. Rechargeable power supply system. Super long standby time. Upper and lower set.

手持式四探针方阻测试仪

二.功能介绍Function introduction：

便携式外型结构更加适用于车间生产、品管抽检，外出携带测量等要求快速便捷测量的场所；也适用于中小型半导体材料生产企业.具有高.

The portable external structure is more suitable for the place where the production of the workshop. the quality of the product. and the measurement of the outside etc. that require quick and easy measurements . It is also suitable for small and medium semiconductor manufacturing enterprises. It has a high performance-price ratio  advantage.


手持式四探针方阻测试仪

三技术参数Technical Parameters：